Advanced Materials Characterization Techniques Analytical DevCourseWeb

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Language
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3.5 GB
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2024-12-02 15:45 (1 year, 11 months ago)
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Files
  1. Get Bonus Downloads Here.url182 bytes
  2. 1 - Introduction.mp416.1 MB
  3. 38 - DTA principle and Instrumentation.mp440.1 MB
  4. 39 - DTA applications factors affecting the analysis.mp4107.2 MB
  5. 40 - Principle of DSC DSC Types and Power Compensaton method.mp4137.7 MB
  6. 41 - Heat Flux Method and DSC Curves.mp488.9 MB
  7. 42 - Factors affecting DSC and Applications of DSC.mp457.6 MB
  8. 2 - Introduction and Development of Electron Microscopy.mp421.2 MB
  9. 3 - Kanaya Okayama Formula and Electron Matter interactions.mp486.1 MB
  10. 4 - SEM Instrumentation and Working Principle.mp495.0 MB
  11. 5 - SEM Instrumentation.mp4271.8 MB
  12. 6 - Transmission Electron Microscopy TEM Instrumentation and Working Principle.mp4129.3 MB
  13. 7 - Comparison of SEM and TEM.mp481.8 MB
  14. 10 - working of AFM.mp429.5 MB
  15. 11 - Modes of AFM and comparison with other microscopies.mp431.9 MB
  16. 12 - Limitations and Applications of AFM.mp422.2 MB
  17. 8 - Atomic force microscopy AFMAtomic Forces.mp462.2 MB
  18. 9 - Principle of AFM.mp446.6 MB
  19. 13 - XPS Photoelectric effect and Xrays.mp456.7 MB
  20. 14 - Binding energy kinetic energy and work function.mp4134.0 MB
  21. 15 - XPSInstrumentation.mp485.8 MB
  22. 16 - Phenomenon associated with XPS.mp438.2 MB
  23. 17 - Chemical Shifts and Spin Orbit Coupling.mp438.9 MB
  24. 18 - Final Shake Up and Shake off Effects.mp421.9 MB
  25. 19 - Angle Resolved XPS.mp416.2 MB
  26. 20 - Raman Spectroscopy Raman Effects Stokes and antiStokes Shift.mp4170.0 MB
  27. 21 - Comparison of Raman with IR.mp428.9 MB
  28. 22 - Raman Instrumentation.mp479.4 MB
  29. 23 - Electron Energy Loss Spectroscopy.mp4103.8 MB
  30. 24 - Surface Plasmons and High energy Loss region.mp463.7 MB
  31. 25 - White lines Fine Edge Structure in XPS Applications and Comparison with EDX.mp4167.8 MB
  32. 26 - EELS Spectral Analysis.mp466.5 MB
  33. 27 - EDX Mechanism and Production of Xray.mp4137.2 MB
  34. 28 - EDX Instrumentation.mp4186.7 MB
  35. 29 - EDX Instrumentations II and Applications of EDX.mp452.7 MB
  36. 30 - XRD principle and Braggs Equation.mp425.5 MB
  37. 31 - XRD Instrumentation and Transmission Laue Method.mp4187.0 MB
  38. 32 - Rotating Crystal method and Powder method of XRD.mp474.2 MB
  39. 33 - Spectral analysis of XRD and Small and Wide anlge Scattering SAXS WAXS.mp4126.4 MB
  40. 34 - Working Principle of TGA.mp466.5 MB
  41. 35 - Instrumentaton of TGA with NULL and DEFLECTION Balanaces.mp4129.6 MB
  42. 36 - TGA instrumentation and factors affecting TGA Curve.mp4111.7 MB
  43. 37 - How to perform sample analysis on TGA.mp457.9 MB
  44. Bonus Resources.txt386 bytes

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